Semiconductor devices. Micro-electromechanical devices - Thin film standard test piece for tensile testingWhat is BS EN 62047 3 Thin film tensile testing about? BS EN 62047 3 is the third part of the multi series standard that focuses on aspects of semiconductor devices. BS EN 62047 3 specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are the main structural materials for microelectromechanical systems

The manufacturers need to adhere to specifications provided in BS 2693-1 and take the necessary steps to ensure that the requirements given in BS 2693-1 are fulfilled

PD IEC TR 61282-2 on single-mode optical fibres is relevant to:

As a user of BS 9251

The working range is restricted by the ion-exchange capacity of any preconcentration columns used and that of the separator column

The main purpose of doing fibre and pulp analysis is to identify the fibre and pulp types

BS L 171 specifies the chemical composition

image polarity

Medical devices that perform one function or several

only general guidance on selection of materials is given

What is BS EN 15288‑2 about

recommended operating and associated characteristics for the family

which is different from that of the devices with rigid substrates